jeudi 3 juillet 2008, 10:56:21 (UTC+0200) # hdparm -I /dev/hdb /dev/hdb: ATA device, with non-removable media Model Number: SAMSUNG SP2514N Serial Number: S08BJ1CPC17969 Firmware Revision: VF100-50 Standards: Used: ATA/ATAPI-7 T13 1532D revision 4a Supported: 7 6 5 4 Configuration: Logical max current cylinders 16383 64761 heads 16 1 sectors/track 63 255 -- CHS current addressable sectors: 16514055 LBA user addressable sectors: 268435455 LBA48 user addressable sectors: 488397168 device size with M = 1024*1024: 238475 MBytes device size with M = 1000*1000: 250059 MBytes (250 GB) Capabilities: LBA, IORDY(can be disabled) Standby timer values: spec'd by Standard, no device specific minimum R/W multiple sector transfer: Max = 16 Current = ? Recommended acoustic management value: 254, current value: 0 DMA: mdma0 mdma1 mdma2 udma0 udma1 udma2 udma3 udma4 *udma5 Cycle time: min=120ns recommended=120ns PIO: pio0 pio1 pio2 pio3 pio4 Cycle time: no flow control=240ns IORDY flow control=120ns Commands/features: Enabled Supported: * SMART feature set Security Mode feature set * Power Management feature set * Write cache * Look-ahead * Host Protected Area feature set * WRITE_BUFFER command * READ_BUFFER command * NOP cmd * DOWNLOAD_MICROCODE Power-Up In Standby feature set SET_FEATURES required to spinup after power up SET_MAX security extension Automatic Acoustic Management feature set * 48-bit Address feature set * Device Configuration Overlay feature set * Mandatory FLUSH_CACHE * FLUSH_CACHE_EXT * SMART error logging * SMART self-test * General Purpose Logging feature set * Segmented DOWNLOAD_MICROCODE * SMART Command Transport (SCT) feature set * SCT Long Sector Access (AC1) * SCT LBA Segment Access (AC2) * SCT Error Recovery Control (AC3) * SCT Features Control (AC4) * SCT Data Tables (AC5) Security: Master password revision code = 65534 supported not enabled not locked frozen not expired: security count supported: enhanced erase 88min for SECURITY ERASE UNIT. 88min for ENHANCED SECURITY ERASE UNIT. HW reset results: CBLID- above Vih Device num = 1 determined by the jumper Checksum: correct 8<-----------8<---------8<----------8<----------8<----------8<----------8< # smartctl -a /dev/hdb smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP2514N Serial Number: S08BJ1CPC17969 Firmware Version: VF100-50 User Capacity: 250 059 350 016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Thu Jul 3 11:09:22 2008 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5065) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 84) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 5760 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 253 253 000 Old_age Always - 1 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4 187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0 190 Unknown_Attribute 0x0022 139 139 000 Old_age Always - 33 194 Temperature_Celsius 0x0022 139 139 000 Old_age Always - 33 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 1964 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 253 253 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. 8<-----------8<---------8<----------8<----------8<----------8<----------8< # smartctl -t short /dev/hdb smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION === Sending command: "Execute SMART Short self-test routine immediately in off-line mode". Drive command "Execute SMART Short self-test routine immediately in off-line mode" successful. Testing has begun. Please wait 1 minutes for test to complete. Test will complete after Thu Jul 3 11:11:35 2008 Use smartctl -X to abort test. 8<-----------8<---------8<----------8<----------8<----------8<----------8< # smartctl -a /dev/hdb smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP2514N Serial Number: S08BJ1CPC17969 Firmware Version: VF100-50 User Capacity: 250 059 350 016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Thu Jul 3 11:14:02 2008 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5065) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 84) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 5760 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 253 253 000 Old_age Always - 2 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4 187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0 190 Unknown_Attribute 0x0022 139 139 000 Old_age Always - 33 194 Temperature_Celsius 0x0022 139 139 000 Old_age Always - 33 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 863877 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 253 253 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 1 - SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. 8<-----------8<---------8<----------8<----------8<----------8<----------8< # badblocks -w -p 2 -s -v /dev/hdb6 8<-----------8<---------8<----------8<----------8<----------8<----------8< vendredi 4 juillet 2008, 10:27:35 (UTC+0200) # smartctl -t short /dev/hdb 8<-----------8<---------8<----------8<----------8<----------8<----------8< # smartctl -a /dev/hdb smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP2514N Serial Number: S08BJ1CPC17969 Firmware Version: VF100-50 User Capacity: 250 059 350 016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Fri Jul 4 10:40:12 2008 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5065) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 84) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 5760 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 253 253 000 Old_age Always - 25 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4 187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0 190 Unknown_Attribute 0x0022 139 124 000 Old_age Always - 33 194 Temperature_Celsius 0x0022 139 124 000 Old_age Always - 33 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 230393161 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 25 - # 2 Short offline Completed without error 00% 1 - SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. 8<-----------8<---------8<----------8<----------8<----------8<----------8< vendredi 4 juillet 2008, 16:09:06 (UTC+0200) # smartctl -a /dev/hdb smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP2514N Serial Number: S08BJ1CPC17969 Firmware Version: VF100-50 User Capacity: 250 059 350 016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Fri Jul 4 16:09:29 2008 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5065) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 84) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 5760 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 253 253 000 Old_age Always - 31 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4 187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0 190 Unknown_Attribute 0x0022 136 124 000 Old_age Always - 34 194 Temperature_Celsius 0x0022 136 124 000 Old_age Always - 34 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 139019080 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 25 - # 2 Short offline Completed without error 00% 1 - SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.